An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science Dr Kathryn Janoski

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science Dr Kathryn JanoskiThis book highlights the application of Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) for high resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual beam ToF SIMS is used to investigate a range of materials systems and properties.

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